A single probe for imaging photons, electrons and physical forces

Summary, in English

The combination of complementary measurement techniques has become a frequent approach to improve scientific knowledge. Pairing of the high lateral resolution scanning force microscopy (SFM) with the spectroscopic information accessible through scanning transmission soft x-ray microscopy (STXM) permits assessing physical and chemical material properties with high spatial resolution. We present progress from the NanoXAS instrument towards using an SFM probe as an x-ray detector for STXM measurements. Just by the variation of one parameter, the SFM probe can be utilised to detect either sample photo-emitted electrons or transmitted photons. This allows the use of a single probe to detect electrons, photons and physical forces of interest. We also show recent progress and demonstrate the current limitations of using a high aspect ratio coaxial SFM probe to detect photo-emitted electrons with very high lateral resolution. Novel probe designs are proposed to further progress in using an SFM probe as a STXM detector.

• Author: Nicolas Pilet; Yuliya Lisunova; Fabio Lamattina; Stephanie E. Stevenson; Giancarlo Pigozzi; Patrycja Paruch; Rainer H. Fink; Hans J. Hug; Christoph Quitmann; Joerg Raabe
• Department/s: MAX IV Laboratory
• Publishing year: 2016-05-05
• Language: English
• Publication/Series: Nanotechnology
• Volume: 27
• Issue: 23
• Links: http://dx.doi.org/10.1088/0957-4484/27/23/235705
• Document type: Journal article
• Publisher: IOP Publishing
• Topic: Nano Technology
• Keywords: carbon nanotube; co-axial tip; electron; photon detection; scanning force microscopy; scanning probe; x-ray microscopy
• Status: Published
• ISBN/ISSN/Other: ISSN: 0957-4484