Large-area microfocal spectroscopic ellipsometry mapping of thickness and electronic properties of epitaxial graphene on Si- and C-face of 3C-SiC(111)

Summary, in English

Microfocal spectroscopic ellipsometry mapping of the electronic properties and thickness of epitaxial graphene grown by high-temperature sublimation on 3C-SiC (111) substrates is reported. Growth of one monolayer graphene is demonstrated on both Si- and C-polarity of the 3C-SiC substrates and it is shown that large area homogeneous single monolayer graphene can be achieved on the Si-face substrates. Correlations between the number of graphene monolayers on one hand and the main transition associated with an exciton enhanced van Hove singularity at similar to 4.5 eV and the free-charge carrier scattering time, on the other are established. It is shown that the interface structure on the Si-and C-polarity of the 3C-SiC(111) differs and has a determining role for the thickness and electronic properties homogeneity of the epitaxial graphene. (C) 2013 AIP Publishing LLC.

• Author: V. Darakchieva; A. Boosalis; Alexei Zakharov; T. Hofmann; M. Schubert; T. E. Tiwald; T. Iakimov; R. Vasiliauskas; R. Yakimova
• Department/s: MAX IV Laboratory
• Publishing year: 2013
• Language: English
• Publication/Series: Applied Physics Letters
• Volume: 102
• Issue: 21
• Links: http://dx.doi.org/10.1063/1.4808379
• Document type: Journal article
• Publisher: American Institute of Physics (AIP)
• Topic: Physical Sciences; Natural Sciences
• Status: Published
• ISBN/ISSN/Other: ISSN: 0003-6951