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Design and Modeling of a High-Speed Scanner for Atomic Force Microscopy

På svenska

Author

  • Georg Schitter
  • Karl Johan Åström
  • Barry E DeMartini
  • Georg E. Fartner
  • Kimberly L. Turner
  • Philipp J. Thurner
  • Paul K. Hansma

Publishing year

2006

Language

English

Pages

502-507

Publication/Series

American Control Conference, 2006

Document type

Conference paper

Topic

  • Control Engineering

Conference name

American Control Conference, 2006

Conference date

2006-06-14 - 2006-06-16

Conference place

Minneapolis, Minnesota, United States

Status

Published