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Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules

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Author

  • N.S. Vinay
  • Indira Rawat
  • M.S. Gaur
  • Erik Larsson
  • Virendra Singh

Publishing year

2010

Language

English

Publication/Series

Design & Test Symposium (EWDTS), 2010 East-West

Document type

Conference paper

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Conference name

IEEE East-West Design and Test Symposium (EWDTS10)

Conference date

2010-09-17 - 2010-09-20

Conference place

St. Petersburg, Russian Federation

Status

Published

ISBN/ISSN/Other

  • ISBN: 978-1-4244-9555-9