The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

Outlier Removal Using Duality

Author

Summary, in English

In this paper we consider the problem of outlier removal for large scale multiview reconstruction problems. An efficient and very popular method for this task is RANSAC. However, as RANSAC only works on a subset of the images, mismatches in longer point tracks may go ndetected. To deal with this problem we would like to have, as a post processing step to RANSAC, a method that works on the entire (or a larger) part of the sequence.



In this paper we consider two algorithms for doing this. The first one is related to a method by Sim & Hartley where a quasiconvex problem is solved repeatedly and the error residuals with the largest error is removed. Instead of solving a quasiconvex problem in each step we show that it is enough to solve a single LP or SOCP which yields a significant speedup. Using duality we show that the same theoretical result holds for our method. The second algorithm is a faster version of the first, and it is related to the popular method of $L_1$-optimization. While it is faster and works very well in practice, there is no theoretical guarantee of success. We show that these two methods are related through duality, and evaluate the methods on a number of data sets with promising results.

Publishing year

2010

Language

English

Pages

1450-1457

Publication/Series

2010 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Document type

Conference paper

Publisher

IEEE - Institute of Electrical and Electronics Engineers Inc.

Topic

  • Computer Vision and Robotics (Autonomous Systems)
  • Mathematics

Conference name

IEEE Int. Conf. on Copmuter Vision and Pattern Recognition

Conference date

2010-06-13 - 2010-06-18

Status

Published

Research group

  • Mathematical Imaging Group

ISBN/ISSN/Other

  • ISSN: 1063-6919
  • ISBN: 978-1-4244-6984-0