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What one can learn about clusters using the unique tools of x-ray photoelectron spectroscopy

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Author

  • Maxim Tchaplyguine
  • Tomas Andersson
  • Chaofan Zhang
  • Mikko-Heikki Mikkela
  • Leena Partanen
  • Marko Huttula
  • Kari Jankala
  • Gunnar Öhrwall
  • Svante Svensson
  • Nils Mårtensson
  • Olle Björneholm
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Summary, in English

This presentation is intended to illustrate various types of collisional processes relevant for free clusters probed by x-ray photoelectron spectroscopy using our own examples ranging from free-electron-metal clusters, through half-metal and semiconductor clusters to dielectrics, the latter from van-der-Waals to ionic clusters.

Department/s

Publishing year

2012

Language

English

Pages

152025-152025

Publication/Series

XXVII International Conference on Photonic, Electronic and Atomic Collisions (Icpeac 2011), Pts 1-15

Volume

388

Document type

Conference paper

Publisher

IOP Publishing

Topic

  • Physical Sciences
  • Natural Sciences

Conference name

27th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC)

Conference date

2011-07-27 - 2011-08-02

Conference place

Ireland

Status

Published

ISBN/ISSN/Other

  • ISSN: 1742-6588
  • ISSN: 1742-6596