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Performance of an On-Demand Beam Excitation System for PIXE Analysis

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Author

Summary, in English

A system for electrostatic on-demand beam excitation in PIXE analysis has been built and carefully tested. Significantly increased count rate capability without any need for corrections for electronic dead time and with less target deterioration makes the system superior to a traditional system with electronic pile-up rejection. By adding a fast external electronic pulse pile-up rejection system, a pile-up interval of about 250 ns is obtained. The detailed behaviour of the particle beam during deflection and experience from using the system in routine analysis are reported.

Publishing year

1982

Language

English

Pages

523-532

Publication/Series

Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment

Volume

192

Issue

2-3

Document type

Journal article

Publisher

Elsevier

Topic

  • Production Engineering, Human Work Science and Ergonomics
  • Subatomic Physics

Keywords

  • PIXE
  • on-demand beam

Status

Published

ISBN/ISSN/Other

  • ISSN: 0167-5087