The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

High-Current GaSb/InAs(Sb) Nanowire Tunnel Field-Effect Transistors

Author

Summary, in English

We present electrical characterization of GaSb/InAs(Sb) nanowire tunnel field-effect transistors. The broken band alignment of the GaSb/InAs(Sb) heterostructure is exploited to allow for interband tunneling without a barrier, leading to high ON-current levels. We report a maximum drive current of 310 μA/μm at Vds = 0.5 V. Devices with scaled gate oxides display transconductances up to gm = 250 mS/mm at Vds = 300 mV, which are normalized to the nanowire circumference at the axial heterojunction.

Publishing year

2013

Language

English

Pages

211-213

Publication/Series

IEEE Electron Device Letters

Volume

34

Issue

2

Document type

Journal article

Publisher

IEEE - Institute of Electrical and Electronics Engineers Inc.

Topic

  • Condensed Matter Physics
  • Electrical Engineering, Electronic Engineering, Information Engineering

Keywords

  • Broken gap
  • GaSb
  • III–V
  • InAs
  • tunnel field-effect transistors (TFETs)

Status

Published

Research group

  • Nano

ISBN/ISSN/Other

  • ISSN: 0741-3106