Test Scheduling and Scan-Chain Division Under Power Constraint
Author
Summary, in English
Publishing year
2001
Language
English
Pages
259-259
Publication/Series
[Host publication title missing]
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Keywords
- scan-chain
- test scheduling
- wrapper design
- testing
- embedded systems
Conference name
Tenth Asian Test Symposium ATS 2001
Conference date
2001-11-19 - 2001-11-21
Conference place
Kyoto, Japan
Status
Published
ISBN/ISSN/Other
- ISSN: 1081-7735
- ISBN: 0-7695-1378-6