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Recent advances in imaging of properties and growth of low dimensional structures for photonics and electronics by XPEEM

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Author

Summary, in English

Spectroscopic Photoemission and Low Energy Electron Microscopy (SPELEEM) is a very powerful and diverse microscopy technique for the investigation of surfaces, interfaces, buried layers and nanoscale objects like nanoparticles and nanowires. The many significant results from photoemission Electron microscopy (PEEM) in recent years are linked with the exploitation of advanced light sources such as synchrotrons and new advanced laser systems. Combined also with low energy electron microscopy (LEEM) it allows a complementary chemical and structural analysis making LEEM/PEEM a versatile multitechnique instrument. To illustrate the extreme diversity, we give a summary of the recent studies with the SPELEEM installed at the soft X-ray beamline 1311 at the MAXII synchrotron storage ring and a portable electrostatic PEEM used with ultra-fast XUV laser technology. The examples cover topics such as full-cone 3D band mapping by using the photoelectron diffraction mode of the microscope, growth mechanism and detailed doping profile of III-V nanowires, growth and intercalation of graphene on SiC substrates, droplet dynamics on GaP(1 1 1) surface, surface chemistry and control of nanostructure fabrication. Moreover, the first results of PEEM experiments using extreme ultraviolet attosecond pulse trains are discussed. (C) 2012 Elsevier B.V. All rights reserved.

Publishing year

2012

Language

English

Pages

417-428

Publication/Series

Journal of Electron Spectroscopy and Related Phenomena

Volume

185

Issue

10

Document type

Journal article

Publisher

Elsevier

Topic

  • Physical Sciences
  • Atom and Molecular Physics and Optics
  • Natural Sciences

Keywords

  • XPEEM
  • Nanowires
  • Graphene
  • Droplet dynamics
  • Short-pulse laser

Status

Published

ISBN/ISSN/Other

  • ISSN: 0368-2048