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On the Application of Elastic Scattering Analysis as a Complement to PIXE for the Determination of Light Elements in Thin Aerosol Samples

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Author

Summary, in English

The potential of elemental analysis of light elements by measuring elastically scattered particles as a complement to PIXE (Particle Induced X-ray Emission analysis), when using a 3 MV electrostatic tandem accelerator is discussed. The discussion is based on protons and He ions with energies suitable for PIXE. Some experimental results of scattering yields are included.

Publishing year

1983

Language

English

Document type

Report

Publisher

[Publisher information missing]

Topic

  • Production Engineering, Human Work Science and Ergonomics
  • Subatomic Physics

Status

Published

Report number

LUTFD2/TFKF-3041)/1-121983)