Characterizing the geometry of InAs nanowires using mirror electron microscopy

Summary, in English

Mirror electron microscopy (MEM) imaging of InAs nanowires is a non-destructive electron microscopy technique where the electrons are reflected via an applied electric field before they reach the specimen surface. However strong caustic features are observed that can be non-intuitive and difficult to relate to nanowire geometry and composition. Utilizing caustic imaging theory we can understand and interpret MEM image contrast, relating caustic image features to the properties and parameters of the nanowire. This is applied to obtain quantitative information, including the nanowire width via a through-focus series of MEM images.

• Author: S. M. Kennedy; Martin Hjort; B. Mandl; Erik Mårsell; Alexei Zakharov; Anders Mikkelsen; D. M. Paganin; D. E. Jesson
• Department/s: Synchrotron Radiation Research; MAX IV Laboratory; NanoLund: Centre for Nanoscience
• Publishing year: 2012
• Language: English
• Publication/Series: Nanotechnology
• Volume: 23
• Issue: 12
• Links: http://dx.doi.org/10.1088/0957-4484/23/12/125703
• Document type: Journal article
• Publisher: IOP Publishing
• Topic: Nano Technology
• Status: Published
• ISBN/ISSN/Other: ISSN: 0957-4484