Defect-Aware SOC Test Scheduling
Author
Summary, in English
Publishing year
2004
Language
English
Pages
359-364
Publication/Series
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Keywords
- system-on-chip
- defect-detection
- test scheduling
- sequential scheduling
- concurrent scheduling
- defect probabilities
Conference name
2004 IEEE VLSI Test Symposium VTS04
Conference date
0001-01-02
Status
Published
ISBN/ISSN/Other
- ISSN: 1093-0167
- ISBN: 0-7695-2134-7