Design, Verification and Application of IEEE 1687

Summary, in English

IEEE 1687 (IJTAG) has been developed to enable flexible and automated access to the increasing number of embedded instruments in today's integrated circuits. These instruments enable efficient post-silicon validation, debugging, wafer sort, package test, burn-in, bring-up and manufacturing test of printed circuit board assemblies, power-on self-test, and in-field test. Current paper presents an overview of challenges as well as selected examples in the following topics around IEEE 1687 networks: (1) design to efficiently access the embedded instruments, (2) verification to ensure correctness, and (3) fault management at functions performed in-field through the product's life time.

• Author: Farrokh Ghani Zadegan; Erik Larsson; Artur Jutman; Sergei Devadze; René Krenz-Baath
• Department/s: Department of Electrical and Information Technology
• Publishing year: 2014
• Language: English
• Pages: 93-100
• Publication/Series: [Host publication title missing]
• Full text: - 2 MB; Download statistics
• Links: http://dx.doi.org/10.1109/ATS.2014.28
• Document type: Conference paper
• Publisher: IEEE - Institute of Electrical and Electronics Engineers Inc.
• Topic: Electrical Engineering, Electronic Engineering, Information Engineering
• Conference name: Asian Test Symposium (ATS14)
• Conference date: 2014-11-16 - 2014-11-19
• Conference place: Hangzhou, China
• Status: Published
• ISBN/ISSN/Other: ISSN: 1081-7735