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EL2-Maps from Computer Based Image Analysis of Semi-Insulating GaAs Wafers

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Author

  • Lars Nielsen
  • Lars Samuelsson
  • Pär Omling
  • Per Silverberg

Publishing year

1985

Language

English

Document type

Conference paper

Topic

  • Control Engineering

Conference name

Symposium on Defect Recognition and Image Processing in III-V Compounds

Conference date

1985-07-02 - 1985-07-04

Conference place

Montpellier, France

Status

Published