Identifying and Modelling Multipath Clusters using Measurement Data
Author
Summary, in English
Publishing year
2010
Language
English
Publication/Series
[Host publication title missing]
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Conference name
IEEE Vehicular Technology Conference (VTC Fall), 2010
Conference date
2010-09-06 - 2010-09-09
Conference place
Ottawa, Canada
Status
Published
ISBN/ISSN/Other
- ISBN: 978-1-4244-3573-9