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Sensitivity analysis of the Benchmark Simulation Model no 1

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Author

  • M.-N. Pons
  • Ulf Jeppsson
  • Xavier Flores
  • L. Benedetti
  • M. Lourenco da Silva
  • I. Nopens
  • J. Alex
  • J.B. Copp
  • K.V. Gernaey
  • Christian Rosén
  • J.-P. Steyer
  • P.A. Vanrolleghem
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Publishing year

2008

Language

English

Document type

Conference paper

Topic

  • Other Electrical Engineering, Electronic Engineering, Information Engineering

Conference name

18th European symposium on Computer Aided Process Engineering (ESCAPE-18)

Conference date

2008-06-01

Conference place

Lyon, France

Status

Published