The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

Time-Domain System for Millimeter-Wave Material Characterization

På svenska

Author

Summary, in English

Time-domain material characterization using a leaky lens antenna and an in-house fabricated millimeter-wave wavelet generator using III-V technology is investigated. The wavelet generator produces short high-frequency pulses and is connected to a wideband and non-dispersive leaky lens antenna. A purely time-domain methodology is used to extract the complex permittivity of non-dispersive and non-magnetic materials. The permittivity is found from the phase delay and the amplitude mismatch introduced by the object at the carrier frequency of the pulse. The wide bandwidth of the wavelet is used to investigate frequency dependent material properties. Measurement results from two dielectric slabs are illustrated. The time-domain methodology is verified by frequency-domain measurements and analysis.

Publishing year

2015

Language

English

Pages

2915-2922

Publication/Series

IEEE Transactions on Microwave Theory and Techniques

Volume

63

Issue

9

Document type

Journal article

Publisher

IEEE - Institute of Electrical and Electronics Engineers Inc.

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Status

Published

Research group

  • Electromagnetic theory

ISBN/ISSN/Other

  • ISSN: 0018-9480