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Material characterization in partially filled waveguides using inverse scattering and multiple sample orientations

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Author

Summary, in English

Abstract in Undetermined
We present a method aimed at reducing uncertainties and instabilities when characterizing materials in waveguide setups. The method is based on measuring the S parameters for three different orientations of a rectangular sample block in a rectangular waveguide. The corresponding geometries are modeled in a commercial full-wave simulation program, taking any material parameters as input. The material parameters of the sample are found by minimizing the squared distance between measured and calculated S parameters. The information added by the different sample orientations is quantified using the Cramer-Rao lower bound. The flexibility of the method allows the determination of material parameters of an arbitrarily shaped sample that fits in the waveguide.

Publishing year

2015

Language

English

Pages

554-561

Publication/Series

Radio Science

Volume

50

Issue

6

Document type

Journal article

Publisher

American Geophysical Union (AGU)

Topic

  • Other Electrical Engineering, Electronic Engineering, Information Engineering

Keywords

  • material characterization
  • waveguide
  • inverse scattering

Status

Published

Research group

  • Electromagnetic theory

ISBN/ISSN/Other

  • ISSN: 0048-6604