SOC Test Time Minimization Under Multiple Constraints
Author
Summary, in English
Publishing year
2003
Language
English
Pages
312-317
Publication/Series
[Host publication title missing]
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Keywords
- SOC
- system-on-chip
- test scheduling
- power limitations
- test conflicts
- test access mechanisms
Conference name
12th IEEE Asian Test Symposium ATS 2003
Conference date
2003-11-16 - 2003-11-19
Status
Published
ISBN/ISSN/Other
- ISSN: 1081-7735
- ISBN: 0-7695-1951-2