Test Time Analysis for IEEE P1687
Author
Summary, in English
Publishing year
2010
Language
English
Pages
455-460
Publication/Series
Test Symposium (ATS), 2010 19th IEEE Asian
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Conference name
19th IEEE Asian Test Symposium (ATS10)
Conference date
2010-12-01 - 2010-12-04
Conference place
Shanghai, China
Status
Published
ISBN/ISSN/Other
- ISBN: 978-1-4244-8841-4