Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters
Author
Summary, in English
The surface-to-bulk intensity ratio in Auger electron spectra has been studied in comparison with core-level photoelectron spectra using free argon clusters of sizes ranging over two orders of magnitude. Enhanced surface sensitivity is observed in L2,3M2,3M2.3 Auger electron spectra compared to 2p photoelectron spectra where electrons of similar kinetic energies were recorded. This is discussed in terms of the effective attenuation length of the electrons.
Department/s
Publishing year
2005
Language
English
Pages
12-19
Publication/Series
Surface Science
Volume
594
Issue
1-3
Document type
Journal article
Publisher
Elsevier
Topic
- Natural Sciences
- Atom and Molecular Physics and Optics
- Physical Sciences
Keywords
- photoelectron
- Auger ejection
- photoelectron spectroscopy
- spectroscopy
- Auger electron
- surface sensitivity
- effective attenuation length-
- synchrotron radiation photoelectron spectroscopy
- emission
Status
Published
ISBN/ISSN/Other
- ISSN: 0039-6028