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Material Characterization in Partially Filled Waveguides Using Inverse Scattering and Multiple Sample Orientations

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Author

Summary, in English

We present a method aimed at reducing uncertainties and instabilities when characterizing materials in waveguide setups. The S-parameters for a rectangular waveguide loaded with a rectangular sample block are measured for three different sample orientations, and the corresponding geometries are modeled in a finite element program, taking any material parameters as input. The material parameters of the sample are found by minimizing the squared distance between measured and calculated S-parameters.

Publishing year

2013

Language

English

Pages

942-945

Publication/Series

[Host publication title missing]

Document type

Conference paper

Publisher

IEEE - Institute of Electrical and Electronics Engineers Inc.

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Conference name

International Symposium on Electromagnetic Theory (EMTS URSI ) 2013

Conference date

2013-05-20 - 2013-05-23

Conference place

Hiroshima, Japan

Status

Published

Research group

  • Electromagnetic theory

ISBN/ISSN/Other

  • ISSN: 2163-405X