The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

Proton-Induced X-Ray Emission in the Trace Analysis of Human Tooth Enamel and Dentine

På svenska

Author

Summary, in English

In this study the feasibility of applying proton-induced X-ray emission spectroscopy (PIXE) to the trace element analysis of human tooth enamel and dentine is investigated. Detection limits on the order of 1–10 ppm are obtained. Depth yields for different elements and proton energies are discussed. Enhancement calculations show that the effect for PIXE analysis is less important than for X-ray induced X-ray analysis. However, for elements with an absorption edge just below an intense X-ray line from a major element the enhancement effect is significant, and, due to the 40% calcium in the enamel matrix, it is estimated to be 15% for potassium. The importance of a smooth sample surface is discussed.

Publishing year

1976

Language

English

Pages

279-290

Publication/Series

International Journal of Applied Radiation and Isotopes

Volume

27

Issue

5-6

Document type

Journal article

Publisher

Elsevier

Topic

  • Environmental Health and Occupational Health

Keywords

  • PIXE
  • trace elements in teeth

Status

Published