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IR-Drop Reduction in Sub-VT Circuits by De-synchronization

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Author

Publishing year

2012

Language

English

Publication/Series

2012 IEEE Subthreshold Microelectronics Conference (SubVT)

Document type

Conference paper

Publisher

IEEE - Institute of Electrical and Electronics Engineers Inc.

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Conference name

IEEE Subthreshold Microelectronics Conference, IEEE-Sub-Vt 2012

Conference date

2012-10-09 - 2012-10-10

Conference place

Waltham, Massachusetts, United States

Status

Published

Research group

  • Elektronikkonstruktion

ISBN/ISSN/Other

  • ISBN: 978-1-4673-1586-9