Fault injection and fault handling: an MPSoC demonstrator using IEEE P1687
Author
Summary, in English
Publishing year
2014
Language
English
Publication/Series
2014 IEEE 20th International On-Line Testing Symposium (IOLTS)
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Keywords
- IEEE P1687
- testing
- fault management
Conference name
20th IEEE International On-Line Testing Symposium
Conference date
2014-07-07
Conference place
Platja d'Aro, Catalunya, Spain
Status
Published
Research group
- Digital ASIC
ISBN/ISSN/Other
- ISBN: 978-1-4799-5324-0