The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

Fault injection and fault handling: an MPSoC demonstrator using IEEE P1687

Author

  • Kim Petersen
  • Dimitar Nikolov
  • Urban Ingelsson
  • Gunnar Carlsson
  • Farrokh Ghani Zadegan
  • Erik Larsson

Summary, in English

As fault handling in multi-processor system-on-chips (MPSoCs) is a major challenge, we have developed an MPSoC demonstrator that enables experimentation on fault injection and fault handling. Our MPSoC demonstrator consists of (1) an MPSoC model with a set of components (devices) each equipped with fault detection features, so called instruments, (2) an Instrument Access Infrastructure (IAI) based on IEEE P1687 that connects the instruments, (3) a Fault Indication and Propagation Infrastructure (FIPI) that propagates fault indications to system-level, (4) a Resource Manager (RM) to schedule jobs based on fault statuses, (5) an Instrument Manager (IM) connecting the IAI and the RM, and (6) a Fault Injection Manager (FIM) that inserts faults. The main goal of the demonstrator is to enable experimentation on different fault handling solutions. The novelty in this particular demonstrator is that it uses the existing test features, i.e. IEEE P1687 infrastructure, to assist fault handling. The demonstrator is implemented and a case study is performed.

Publishing year

2014

Language

English

Publication/Series

2014 IEEE 20th International On-Line Testing Symposium (IOLTS)

Document type

Conference paper

Publisher

IEEE - Institute of Electrical and Electronics Engineers Inc.

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Keywords

  • IEEE P1687
  • testing
  • fault management

Conference name

20th IEEE International On-Line Testing Symposium

Conference date

2014-07-07

Conference place

Platja d'Aro, Catalunya, Spain

Status

Published

Research group

  • Digital ASIC

ISBN/ISSN/Other

  • ISBN: 978-1-4799-5324-0