Navigating Information Overload Caused by Automated Testing – A Clustering Approach in Multi-Branch Development
Author
Summary, in English
reducing information overload.
Department/s
Publishing year
2015
Language
English
Publication/Series
2015 IEEE 8th International Conference on Software Testing, Verification and Validation, ICST 2015 - Proceedings
Full text
- Available as PDF - 507 kB
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Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
- Computer Science
Keywords
- software testing
- test automation
- test result analysis
- clustering
- case study
Conference name
International Conference on Software Testing, Verification and Validation, 2015
Conference date
2015-04-13 - 2015-04-17
Conference place
Graz, Austria
Status
Published
Project
- Embedded Applications Software Engineering
- Embedded Applications Software Engineering
ISBN/ISSN/Other
- ISBN: 9781479971251