Electronic and structural properties of the Cu - Bi₂CaSr₂Cu₂O₈ interface

Summary, in English

The formation of the Cu-Bi₂CaSr₂Cu₂O₈ interface has been studied by photoelectron spectroscopy using synchrotron radiation. Photon energies in the range 20-1000 eV were utilized in order to probe both the valence band and to monitor chemical changes upon Cu deposition, as revealed by the core-level shifts. A strong chemical reaction between Bi₂CaSr₂Cu₂O₈ and Cu is manifested by the formation of metallic Bi. From theb density variations as a function of electron emission angle it is shown that the metallic Bi segregates to the top surface layer.

• Author: H. Bernhoff; M. Qvarford; S. Söderholm; A. S. Flodström; J. N. Andersen; R. Nyholm; U. O. Karlsson; I. Lindau
• Department/s: MAX IV Laboratory; Synchrotron Radiation Research
• Publishing year: 1991
• Language: English
• Pages: 120-123
• Publication/Series: Physica C: Superconductivity and its Applications
• Volume: 180
• Issue: 1-4
• Links: http://dx.doi.org/10.1016/0921-4534(91)90649-J
• Document type: Journal article
• Publisher: Elsevier
• Status: Published
• ISBN/ISSN/Other: ISSN: 0921-4534