The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

Calibration and Long-Term Stability of a PIXE Set-Up

Author

Summary, in English

A general mass calibration procedure of a PIXE set-up is described. As an example, the results of the calibration of the PIXE set-up in Lund are given. For the calibration commercially available standards were used. The parameters of a physical model were adjusted to fit a calibration curve. To decrease errors due to inhomogeneities of the standard foils, the average from four different pieces of each foil was taken. The accuracy of the calibrated system in Lund is estimated to be better than 5% for individual elements and still less for ratios of adjacent elements.

For long-term quality control of the results, a special sample has been designed. This consists of a thick silver plate with a small copper spot in the centre. It is very sensitive to small changes in a PIXE set-up. By analysing this sample periodically, mistakes in the arrangement are promptly detected-a feature which is much appreciated in a mixed research, development and routine analysis laboratory. Also a measure of the long-term stability is obtained. For the Lund system, the long-term stability is 2.5% for a homogeneous sample and 4% for a small (inhomogeneous) sample.

Publishing year

1981

Language

English

Pages

81-88

Publication/Series

Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment

Volume

181

Issue

1-3

Document type

Journal article

Publisher

Elsevier

Topic

  • Subatomic Physics
  • Production Engineering, Human Work Science and Ergonomics

Keywords

  • PIXE
  • long-term stability

Status

Published

ISBN/ISSN/Other

  • ISSN: 0167-5087