Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
Author
Summary, in English
Publishing year
2007
Language
English
Pages
859-859
Publication/Series
[Host publication title missing]
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Keywords
- embedded systems
- testing
- FIFO
- memory
- test quality analysis
Conference name
Design, Automation, and Test in Europe DATE
Conference date
2007-04-16 - 2007-04-20
Conference place
Nice, France
Status
Published
Research group
- Digital ASIC
ISBN/ISSN/Other
- ISBN: 978-3-9810801-2-4